Christopher Haster
4af4cf3212
- -S/--probe - Specify a probe to sample.
- -x/--probe-step - Sample probes every n steps.
- --probe-runfreq - Sample probes at this frequency in hz.
- -X/--probe-simfreq - Sample probes at this frequency in simulated hz.
Also:
- --trace-simfreq - Sample trace output at this frequency in
simulated hz.
These give finer grain control over which probes we measure during
benching, and how we measure them.
These also introduce several exciting bench features:
- -S/--probe provides the ability to easily filter which probes you're
interested in at runtime.
This should replace the growing use of MASK defines in the benches.
- -x/--probe-step makes it easy to relax sampling rate when the amount
of data overwhelms later scripts.
This should replace the growing use of STEP defines in the benches.
- The additional concept of simfreq, which allows perf-esque sampling in
simtime. This provides another option for intuitively relaxing probe
sampling rate without sacrificing reproducibility.
(runfreq depends on wall time, so good bye reproducibility, though may
still be useful in interactive contexts.)
Note -S/--probe and -x/--probe-step replace MASK/STEP defines, which
have already proved their usefulness, but required reimplementation in
every bench case. An obvious contender to move into the bench_runner!
---
Note note that -S/--probe also supports some simple sample expressions,
allowing flexible step/simfreq/runfreq at the per-probe level:
- -Swrite=100 - Sample probe "write" every 100 steps
- -Swrite=100rhz - Sample probe "write" 100 times a runtime second
- -Swrite=100shz - Sample probe "write" 100 times a simulated second
Though I wonder how long it will take before I forget this feature
exists.
172 lines
4.2 KiB
C
172 lines
4.2 KiB
C
/*
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* Runner for littlefs tests
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*
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* Copyright (c) 2022, The littlefs authors.
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* SPDX-License-Identifier: BSD-3-Clause
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*/
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#ifndef TEST_RUNNER_H
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#define TEST_RUNNER_H
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#define TEST_STRINGIFY_(x) #x
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#define TEST_STRINGIFY(x) TEST_STRINGIFY_(x)
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// the default TEST_DEFINES path can be overridden to add shims for
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// other filesystems out-of-tree
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//
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// note this is an unusual header file! instead of being included once,
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// TEST_DEFINES is included several times with various "query macros"
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// defined before inclusion:
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//
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// - TEST_INCLUDE - common includes (optional)
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// - TEST_DEFINE(name, value) - name and default values for test defines
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// - TEST_CFG[+_CFG] - struct lfs3_cfg definition
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// - TEST_BDCFG[+_CFG] - struct lfs3_*bd_cfg definition
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//
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#ifndef TEST_DEFINES
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#define TEST_DEFINES runners/test_defines.h
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#endif
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// default to using emubd for tests
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#if !defined(TEST_EMUBD) && !defined(TEST_KIWIBD)
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#define TEST_EMUBD
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#endif
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// ifdef macros for emubd vs kiwibd
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#ifdef TEST_EMUBD
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#define TEST_IFDEF_EMUBD(a, b) (a)
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#else
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#define TEST_IFDEF_EMUBD(a, b) (b)
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#endif
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#ifdef TEST_KIWIBD
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#define TEST_IFDEF_KIWIBD(a, b) (a)
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#else
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#define TEST_IFDEF_KIWIBD(a, b) (b)
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#endif
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// override LFS3_TRACE
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#ifndef LFS3_NO_TRACE
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void test_trace(const char *fmt, ...);
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#define LFS3_TRACE_(fmt, ...) \
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test_trace("%s:%d:trace: " fmt "%s\n", __FILE__, __LINE__, __VA_ARGS__)
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#define LFS3_TRACE(...) LFS3_TRACE_(__VA_ARGS__, "")
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#define LFS3_EMUBD_TRACE(...) LFS3_TRACE_(__VA_ARGS__, "")
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#define LFS3_KIWIBD_TRACE(...) LFS3_TRACE_(__VA_ARGS__, "")
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#else
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#define LFS3_TRACE(...)
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#define LFS3_EMUBD_TRACE(...)
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#define LFS3_KIWIBD_TRACE(...)
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#endif
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// note these are indirectly included in any generated files
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#define TEST_INCLUDE
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#include TEST_STRINGIFY(TEST_DEFINES)
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#undef TEST_INCLUDE
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#ifndef TEST_KIWIBD
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#include "bd/lfs3_emubd.h"
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#else
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#include "bd/lfs3_kiwibd.h"
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#endif
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#include "lfs3_util.h"
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#include <stdio.h>
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#include <stdint.h>
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// give source a chance to define feature macros
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#undef _FEATURES_H
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#undef _STDIO_H
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// some common types
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#ifndef TEST_KIWIBD
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typedef lfs3_emubd_ns_t test_ns_t;
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typedef lfs3_emubd_sns_t test_sns_t;
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typedef lfs3_emubd_powercycles_t test_powercycles_t;
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typedef lfs3_emubd_spowercycles_t test_spowercycles_t;
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#else
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typedef lfs3_kiwibd_ns_t test_ns_t;
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typedef lfs3_kiwibd_sns_t test_sns_t;
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typedef void test_powercycles_t;
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typedef void test_spowercycles_t;
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#endif
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// generated test configurations
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struct lfs3_cfg;
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enum test_flags {
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TEST_INTERNAL = 0x1,
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TEST_REENTRANT = 0x2,
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TEST_FUZZ = 0x4,
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};
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typedef uint8_t test_flags_t;
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typedef struct test_define {
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const char *name;
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intmax_t *define;
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intmax_t (*cb)(void *data, size_t i);
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void *data;
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size_t permutations;
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} test_define_t;
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struct test_case {
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const char *name;
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const char *path;
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test_flags_t flags;
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const test_define_t *defines;
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size_t permutations;
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bool (*if_)(void);
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void (*run)(const struct lfs3_cfg *cfg);
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};
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struct test_suite {
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const char *name;
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const char *path;
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test_flags_t flags;
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const test_define_t *defines;
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size_t define_count;
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const struct test_case *cases;
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size_t case_count;
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};
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extern const struct test_suite *const test_suites[];
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extern const size_t test_suite_count;
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// this variable tracks the number of powerlosses triggered during the
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// current test permutation, this is useful for both tests and debugging
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extern volatile size_t TEST_PLS;
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// deterministic prng for pseudo-randomness in tests
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uint32_t test_prng(uint32_t *state);
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#define TEST_PRNG(state) test_prng(state)
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// generation of specific permutations of an array for exhaustive testing
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size_t test_factorial(size_t x);
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void test_permutation(size_t i, uint32_t *buffer, size_t size);
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#define TEST_FACTORIAL(x) test_factorial(x)
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#define TEST_PERMUTATION(i, buffer, size) test_permutation(i, buffer, size)
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// option to pause trace output
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void test_trace_pause(void);
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void test_trace_resume(void);
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#define TEST_TRACE_PAUSE() test_trace_pause()
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#define TEST_TRACE_RESUME() test_trace_resume()
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// declare implicit defines as global intmax_ts
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#define TEST_DEFINE(k, v) \
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extern intmax_t k;
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#include TEST_STRINGIFY(TEST_DEFINES)
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#undef TEST_DEFINE
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#endif
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