Files
littlefs/runners/test_runner.h
T
Christopher Haster eced943685 Changed gc_steps into a runtime parameter, better dedup mount gc
So instead of configuring gc_steps at mount time (or eventually compile
time), lfsr_fs_gc now takes a steps parameter that controls how much gc
work to attempt:

  int lfsr_fs_gc(lfs_t *lfs, lfs_soff_t steps, uint32_t flags);

This API was needed internally to better deduplicate on-mount gc, and I
figured it might also be useful for users to be able to easily change
gc_steps per lfsr_fs_gc call.

I realize this could also be accomplished with the theoretical
lfsr_fs_gccfg, but it's a bit easier to not need a struct every call.

Most likely, depending on project/system, users will always call
lfsr_fs_gc with either 1 (minimal work) or -1 (maximal work), or, worst
case, can define a system-wide GC_STEPS somewhere.

---

Deduplicating on-mount gc work better saved some code, though it's worth
noting this could have been done internally and not exposed to users:

           code          stack
  before: 36476           2680 (+0.0%)
  after:  36316 (-0.4%)   2680 (+0.0%)
2024-07-18 20:46:58 -05:00

152 lines
5.0 KiB
C

/*
* Runner for littlefs tests
*
* Copyright (c) 2022, The littlefs authors.
* SPDX-License-Identifier: BSD-3-Clause
*/
#ifndef TEST_RUNNER_H
#define TEST_RUNNER_H
// override LFS_TRACE
void test_trace(const char *fmt, ...);
#define LFS_TRACE_(fmt, ...) \
test_trace("%s:%d:trace: " fmt "%s\n", \
__FILE__, \
__LINE__, \
__VA_ARGS__)
#define LFS_TRACE(...) LFS_TRACE_(__VA_ARGS__, "")
#define LFS_EMUBD_TRACE(...) LFS_TRACE_(__VA_ARGS__, "")
// note these are indirectly included in any generated files
#include "bd/lfs_emubd.h"
#include <stdio.h>
// give source a chance to define feature macros
#undef _FEATURES_H
#undef _STDIO_H
// generated test configurations
struct lfs_config;
enum test_flags {
TEST_INTERNAL = 0x1,
TEST_REENTRANT = 0x2,
TEST_FUZZ = 0x4,
};
typedef uint8_t test_flags_t;
typedef struct test_define {
const char *name;
intmax_t *define;
intmax_t (*cb)(void *data, size_t i);
void *data;
size_t permutations;
} test_define_t;
struct test_case {
const char *name;
const char *path;
test_flags_t flags;
const test_define_t *defines;
size_t permutations;
bool (*if_)(void);
void (*run)(struct lfs_config *cfg);
};
struct test_suite {
const char *name;
const char *path;
test_flags_t flags;
const test_define_t *defines;
size_t define_count;
const struct test_case *cases;
size_t case_count;
};
extern const struct test_suite *const test_suites[];
extern const size_t test_suite_count;
// this variable tracks the number of powerlosses triggered during the
// current test permutation, this is useful for both tests and debugging
extern volatile size_t TEST_PLS;
// deterministic prng for pseudo-randomness in tests
uint32_t test_prng(uint32_t *state);
#define TEST_PRNG(state) test_prng(state)
// generation of specific permutations of an array for exhaustive testing
size_t test_factorial(size_t x);
void test_permutation(size_t i, uint32_t *buffer, size_t size);
#define TEST_FACTORIAL(x) test_factorial(x)
#define TEST_PERMUTATION(i, buffer, size) test_permutation(i, buffer, size)
// a few preconfigured defines that control how tests run
#define TEST_IMPLICIT_DEFINES \
/* name value (overridable) */ \
TEST_DEFINE(READ_SIZE, 1 ) \
TEST_DEFINE(PROG_SIZE, 1 ) \
TEST_DEFINE(BLOCK_SIZE, 4096 ) \
TEST_DEFINE(BLOCK_COUNT, DISK_SIZE/BLOCK_SIZE ) \
TEST_DEFINE(DISK_SIZE, 1024*1024 ) \
TEST_DEFINE(BLOCK_RECYCLES, -1 ) \
TEST_DEFINE(RCACHE_SIZE, LFS_MAX(16, READ_SIZE) ) \
TEST_DEFINE(PCACHE_SIZE, LFS_MAX(16, PROG_SIZE) ) \
TEST_DEFINE(FILE_BUFFER_SIZE, 16 ) \
TEST_DEFINE(LOOKAHEAD_SIZE, 16 ) \
TEST_DEFINE(GC_COMPACT_THRESH, 0 ) \
TEST_DEFINE(INLINE_SIZE, BLOCK_SIZE/4 ) \
TEST_DEFINE(SHRUB_SIZE, INLINE_SIZE ) \
TEST_DEFINE(FRAGMENT_SIZE, BLOCK_SIZE/8 ) \
TEST_DEFINE(CRYSTAL_THRESH, BLOCK_SIZE/8 ) \
TEST_DEFINE(ERASE_VALUE, 0xff ) \
TEST_DEFINE(ERASE_CYCLES, 0 ) \
TEST_DEFINE(BADBLOCK_BEHAVIOR, LFS_EMUBD_BADBLOCK_PROGERROR ) \
TEST_DEFINE(POWERLOSS_BEHAVIOR, LFS_EMUBD_POWERLOSS_NOOP ) \
TEST_DEFINE(EMUBD_SEED, 0 )
// declare defines as global intmax_ts
#define TEST_DEFINE(k, v) \
extern intmax_t k;
TEST_IMPLICIT_DEFINES
#undef TEST_DEFINE
// map defines to cfg struct fields
#define TEST_CFG \
.read_size = READ_SIZE, \
.prog_size = PROG_SIZE, \
.block_size = BLOCK_SIZE, \
.block_count = BLOCK_COUNT, \
.block_recycles = BLOCK_RECYCLES, \
.rcache_size = RCACHE_SIZE, \
.pcache_size = PCACHE_SIZE, \
.file_buffer_size = FILE_BUFFER_SIZE, \
.lookahead_size = LOOKAHEAD_SIZE, \
.gc_compact_thresh = GC_COMPACT_THRESH, \
.inline_size = INLINE_SIZE, \
.shrub_size = SHRUB_SIZE, \
.fragment_size = FRAGMENT_SIZE, \
.crystal_thresh = CRYSTAL_THRESH,
#define TEST_BDCFG \
.erase_value = ERASE_VALUE, \
.erase_cycles = ERASE_CYCLES, \
.badblock_behavior = BADBLOCK_BEHAVIOR, \
.powerloss_behavior = POWERLOSS_BEHAVIOR, \
.seed = EMUBD_SEED,
#endif