Christopher Haster
4da7c88eb0
The previous encoding was a bit problematic with our linear and log
heuristics, which can grow thousands of powerlosses deep. You know you
have a problem when you're copying a test id that spans a dozen lines.
It also meant we were spending O(n^2) time just encoding powerloss ids:
before: 942.68s
after: 921.94s (-2.2%)
This new encoding takes advantage of the unused characters in our leb16
encoding, with an 'x' prefix indicating linear-heuristic powerlosses
and a 'y' prefix indicating log-heuristic powerlosses ('w' is used for
negative leb16s).
Before:
- explicit: 42q2q2
- linear: 123456789abcdefg1h1i1j1k1l1m1n1o1p1q1r1s1t1u1v1
- log: 1248g1g2g4g8gg1gg2gg4gg8
After:
- explicit: 42q2q2
- linear: xg2
- log: yc
176 lines
5.8 KiB
C
176 lines
5.8 KiB
C
/*
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* Runner for littlefs tests
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*
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* Copyright (c) 2022, The littlefs authors.
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* SPDX-License-Identifier: BSD-3-Clause
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*/
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#ifndef TEST_RUNNER_H
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#define TEST_RUNNER_H
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// override LFS_TRACE
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void test_trace(const char *fmt, ...);
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#define LFS_TRACE_(fmt, ...) \
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test_trace("%s:%d:trace: " fmt "%s\n", \
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__FILE__, \
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__LINE__, \
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__VA_ARGS__)
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#define LFS_TRACE(...) LFS_TRACE_(__VA_ARGS__, "")
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#define LFS_EMUBD_TRACE(...) LFS_TRACE_(__VA_ARGS__, "")
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// note these are indirectly included in any generated files
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#include "bd/lfs_emubd.h"
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#include <stdio.h>
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// give source a chance to define feature macros
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#undef _FEATURES_H
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#undef _STDIO_H
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// generated test configurations
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struct lfs_config;
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enum test_flags {
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TEST_INTERNAL = 0x1,
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TEST_REENTRANT = 0x2,
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};
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typedef uint8_t test_flags_t;
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typedef struct test_define {
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intmax_t (*cb)(void *data, size_t i);
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void *data;
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size_t permutations;
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} test_define_t;
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struct test_case {
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const char *name;
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const char *path;
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test_flags_t flags;
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const test_define_t *defines;
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size_t permutations;
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bool (*if_)(void);
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void (*run)(struct lfs_config *cfg);
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};
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struct test_suite {
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const char *name;
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const char *path;
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test_flags_t flags;
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const char *const *define_names;
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size_t define_count;
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const struct test_case *cases;
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size_t case_count;
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};
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extern const struct test_suite *const test_suites[];
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extern const size_t test_suite_count;
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// this variable tracks the number of powerlosses triggered during the
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// current test permutation, this is useful for both tests and debugging
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extern volatile size_t test_pls;
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#define TEST_PLS test_pls
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// deterministic prng for pseudo-randomness in tests
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uint32_t test_prng(uint32_t *state);
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#define TEST_PRNG(state) test_prng(state)
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// generation of specific permutations of an array for exhaustive testing
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size_t test_factorial(size_t x);
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void test_permutation(size_t i, uint32_t *buffer, size_t size);
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#define TEST_FACTORIAL(x) test_factorial(x)
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#define TEST_PERMUTATION(i, buffer, size) test_permutation(i, buffer, size)
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// access generated test defines
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intmax_t test_define(size_t define);
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#define TEST_DEFINE(i) test_define(i)
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// a few preconfigured defines that control how tests run
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#define READ_SIZE_i 0
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#define PROG_SIZE_i 1
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#define BLOCK_SIZE_i 2
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#define BLOCK_COUNT_i 3
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#define DISK_SIZE_i 4
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#define CACHE_SIZE_i 5
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#define INLINE_SIZE_i 6
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#define SHRUB_SIZE_i 7
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#define FRAGMENT_SIZE_i 8
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#define CRYSTAL_SIZE_i 9
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#define LOOKAHEAD_SIZE_i 10
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#define BLOCK_CYCLES_i 11
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#define ERASE_VALUE_i 12
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#define ERASE_CYCLES_i 13
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#define BADBLOCK_BEHAVIOR_i 14
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#define POWERLOSS_BEHAVIOR_i 15
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#define TEST_IMPLICIT_DEFINE_COUNT 16
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#define READ_SIZE TEST_DEFINE(READ_SIZE_i)
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#define PROG_SIZE TEST_DEFINE(PROG_SIZE_i)
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#define BLOCK_SIZE TEST_DEFINE(BLOCK_SIZE_i)
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#define BLOCK_COUNT TEST_DEFINE(BLOCK_COUNT_i)
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#define DISK_SIZE TEST_DEFINE(DISK_SIZE_i)
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#define CACHE_SIZE TEST_DEFINE(CACHE_SIZE_i)
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#define INLINE_SIZE TEST_DEFINE(INLINE_SIZE_i)
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#define SHRUB_SIZE TEST_DEFINE(SHRUB_SIZE_i)
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#define FRAGMENT_SIZE TEST_DEFINE(FRAGMENT_SIZE_i)
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#define CRYSTAL_SIZE TEST_DEFINE(CRYSTAL_SIZE_i)
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#define LOOKAHEAD_SIZE TEST_DEFINE(LOOKAHEAD_SIZE_i)
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#define BLOCK_CYCLES TEST_DEFINE(BLOCK_CYCLES_i)
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#define ERASE_VALUE TEST_DEFINE(ERASE_VALUE_i)
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#define ERASE_CYCLES TEST_DEFINE(ERASE_CYCLES_i)
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#define BADBLOCK_BEHAVIOR TEST_DEFINE(BADBLOCK_BEHAVIOR_i)
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#define POWERLOSS_BEHAVIOR TEST_DEFINE(POWERLOSS_BEHAVIOR_i)
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#define TEST_IMPLICIT_DEFINES \
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/* name value (overridable) */ \
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TEST_DEF(READ_SIZE, 1 ) \
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TEST_DEF(PROG_SIZE, 1 ) \
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TEST_DEF(BLOCK_SIZE, 4096 ) \
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TEST_DEF(BLOCK_COUNT, DISK_SIZE/BLOCK_SIZE ) \
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TEST_DEF(DISK_SIZE, 1024*1024 ) \
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TEST_DEF(CACHE_SIZE, lfs_max(16, lfs_max(READ_SIZE, PROG_SIZE)) ) \
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TEST_DEF(INLINE_SIZE, BLOCK_SIZE/8 ) \
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TEST_DEF(SHRUB_SIZE, INLINE_SIZE ) \
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TEST_DEF(FRAGMENT_SIZE, CACHE_SIZE ) \
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TEST_DEF(CRYSTAL_SIZE, BLOCK_SIZE/8 ) \
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TEST_DEF(LOOKAHEAD_SIZE, 16 ) \
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TEST_DEF(BLOCK_CYCLES, -1 ) \
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TEST_DEF(ERASE_VALUE, 0xff ) \
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TEST_DEF(ERASE_CYCLES, 0 ) \
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TEST_DEF(BADBLOCK_BEHAVIOR, LFS_EMUBD_BADBLOCK_PROGERROR ) \
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TEST_DEF(POWERLOSS_BEHAVIOR, LFS_EMUBD_POWERLOSS_NOOP )
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#define TEST_CFG \
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.read_size = READ_SIZE, \
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.prog_size = PROG_SIZE, \
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.block_size = BLOCK_SIZE, \
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.block_count = BLOCK_COUNT, \
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.block_cycles = BLOCK_CYCLES, \
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.cache_size = CACHE_SIZE, \
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.inline_size = INLINE_SIZE, \
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.shrub_size = SHRUB_SIZE, \
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.fragment_size = FRAGMENT_SIZE, \
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.crystal_size = CRYSTAL_SIZE, \
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.lookahead_size = LOOKAHEAD_SIZE,
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#define TEST_BDCFG \
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.erase_value = ERASE_VALUE, \
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.erase_cycles = ERASE_CYCLES, \
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.badblock_behavior = BADBLOCK_BEHAVIOR,
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#endif
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