Files
littlefs/runners/test_runner.h
T
Christopher Haster b4af52bc72 Implemented SOMEBITS/MOSTBITS emubd powerloss behavior
These emulate powerloss behavior where only some of the bits being
progged are actually progged if there is a powerloss. This behavior was
the original motivation for our ecksums/fcrcs, so it's good to have this
tested.

As a simplification, these only test the extremes:

- LFS_EMUBD_POWERLOSS_SOMEBITS => one bit progged
- LFS_EMUBD_POWERLOSS_MOSTBITS => all-but-one bit progged

Also they flips bits instead of preserving exact partial prog behavior,
but this is allowed (progs can have any intermediate value), has the
same effect as partial progs, and should encourage failed progs.

This required a number of tweaks in emubd: moved powerloss before prog,
moved mutate after powerloss, etc, but these shouldn't affect other
powerloss behaviors. Handling powerloss after prog was only to avoid
power_cycles=1 being useless, it's not strictly required.

Good news is testing so far suggests our ecksum design is sound.
2024-06-06 16:58:18 -05:00

152 lines
5.0 KiB
C

/*
* Runner for littlefs tests
*
* Copyright (c) 2022, The littlefs authors.
* SPDX-License-Identifier: BSD-3-Clause
*/
#ifndef TEST_RUNNER_H
#define TEST_RUNNER_H
// override LFS_TRACE
void test_trace(const char *fmt, ...);
#define LFS_TRACE_(fmt, ...) \
test_trace("%s:%d:trace: " fmt "%s\n", \
__FILE__, \
__LINE__, \
__VA_ARGS__)
#define LFS_TRACE(...) LFS_TRACE_(__VA_ARGS__, "")
#define LFS_EMUBD_TRACE(...) LFS_TRACE_(__VA_ARGS__, "")
// note these are indirectly included in any generated files
#include "bd/lfs_emubd.h"
#include <stdio.h>
// give source a chance to define feature macros
#undef _FEATURES_H
#undef _STDIO_H
// generated test configurations
struct lfs_config;
enum test_flags {
TEST_INTERNAL = 0x1,
TEST_REENTRANT = 0x2,
TEST_FUZZ = 0x4,
};
typedef uint8_t test_flags_t;
typedef struct test_define {
const char *name;
intmax_t *define;
intmax_t (*cb)(void *data, size_t i);
void *data;
size_t permutations;
} test_define_t;
struct test_case {
const char *name;
const char *path;
test_flags_t flags;
const test_define_t *defines;
size_t permutations;
bool (*if_)(void);
void (*run)(struct lfs_config *cfg);
};
struct test_suite {
const char *name;
const char *path;
test_flags_t flags;
const test_define_t *defines;
size_t define_count;
const struct test_case *cases;
size_t case_count;
};
extern const struct test_suite *const test_suites[];
extern const size_t test_suite_count;
// this variable tracks the number of powerlosses triggered during the
// current test permutation, this is useful for both tests and debugging
extern volatile size_t TEST_PLS;
// deterministic prng for pseudo-randomness in tests
uint32_t test_prng(uint32_t *state);
#define TEST_PRNG(state) test_prng(state)
// generation of specific permutations of an array for exhaustive testing
size_t test_factorial(size_t x);
void test_permutation(size_t i, uint32_t *buffer, size_t size);
#define TEST_FACTORIAL(x) test_factorial(x)
#define TEST_PERMUTATION(i, buffer, size) test_permutation(i, buffer, size)
// a few preconfigured defines that control how tests run
#define TEST_IMPLICIT_DEFINES \
/* name value (overridable) */ \
TEST_DEFINE(READ_SIZE, 1 ) \
TEST_DEFINE(PROG_SIZE, 1 ) \
TEST_DEFINE(BLOCK_SIZE, 4096 ) \
TEST_DEFINE(BLOCK_COUNT, DISK_SIZE/BLOCK_SIZE ) \
TEST_DEFINE(DISK_SIZE, 1024*1024 ) \
TEST_DEFINE(BLOCK_RECYCLES, -1 ) \
TEST_DEFINE(RCACHE_SIZE, LFS_MAX(16, READ_SIZE) ) \
TEST_DEFINE(PCACHE_SIZE, LFS_MAX(16, PROG_SIZE) ) \
TEST_DEFINE(FILE_BUFFER_SIZE, 16 ) \
TEST_DEFINE(LOOKAHEAD_SIZE, 16 ) \
TEST_DEFINE(INLINE_SIZE, BLOCK_SIZE/4 ) \
TEST_DEFINE(SHRUB_SIZE, INLINE_SIZE ) \
TEST_DEFINE(FRAGMENT_SIZE, BLOCK_SIZE/8 ) \
TEST_DEFINE(CRYSTAL_THRESH, BLOCK_SIZE/8 ) \
TEST_DEFINE(CHECK_PROGS, false ) \
TEST_DEFINE(ERASE_VALUE, 0xff ) \
TEST_DEFINE(ERASE_CYCLES, 0 ) \
TEST_DEFINE(BADBLOCK_BEHAVIOR, LFS_EMUBD_BADBLOCK_PROGERROR ) \
TEST_DEFINE(POWERLOSS_BEHAVIOR, LFS_EMUBD_POWERLOSS_NOOP ) \
TEST_DEFINE(EMUBD_SEED, 0 )
// declare defines as global intmax_ts
#define TEST_DEFINE(k, v) \
extern intmax_t k;
TEST_IMPLICIT_DEFINES
#undef TEST_DEFINE
// map defines to cfg struct fields
#define TEST_CFG \
.read_size = READ_SIZE, \
.prog_size = PROG_SIZE, \
.block_size = BLOCK_SIZE, \
.block_count = BLOCK_COUNT, \
.block_recycles = BLOCK_RECYCLES, \
.rcache_size = RCACHE_SIZE, \
.pcache_size = PCACHE_SIZE, \
.file_buffer_size = FILE_BUFFER_SIZE, \
.lookahead_size = LOOKAHEAD_SIZE, \
.inline_size = INLINE_SIZE, \
.shrub_size = SHRUB_SIZE, \
.fragment_size = FRAGMENT_SIZE, \
.crystal_thresh = CRYSTAL_THRESH, \
.check_progs = CHECK_PROGS,
#define TEST_BDCFG \
.erase_value = ERASE_VALUE, \
.erase_cycles = ERASE_CYCLES, \
.badblock_behavior = BADBLOCK_BEHAVIOR, \
.powerloss_behavior = POWERLOSS_BEHAVIOR, \
.seed = EMUBD_SEED,
#endif