Christopher Haster
5be7bae518
The previous system of relying on test name prefixes for ordering was simple, but organizing tests by dependencies and topologically sorting during compilation is 1. more flexible and 2. simplifies test names, which get typed a lot. Note these are not "hard" dependencies, each test suite should work fine in isolation. These "after" dependencies just hint an ordering when all tests are ran. As such, it's worth noting the tests should NOT error of a dependency is missing. This unfortunately makes it a bit hard to catch typos, but allows faster compilation of a subset of tests. --- To make this work the way tests are linked has changed from using custom linker section (fun linker magic!) to a weakly linked array appended to every source file (also fun linker magic!). At least with this method test.py has strict control over the test ordering, and doesn't depend on 1. the order in which the linker merges sections, and 2. the order tests are passed to test.py. I didn't realize the previous system was so fragile.
154 lines
4.7 KiB
C
154 lines
4.7 KiB
C
/*
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* Runner for littlefs tests
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*
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* Copyright (c) 2022, The littlefs authors.
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* SPDX-License-Identifier: BSD-3-Clause
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*/
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#ifndef TEST_RUNNER_H
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#define TEST_RUNNER_H
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// override LFS_TRACE
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void test_trace(const char *fmt, ...);
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#define LFS_TRACE_(fmt, ...) \
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test_trace("%s:%d:trace: " fmt "%s\n", \
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__FILE__, \
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__LINE__, \
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__VA_ARGS__)
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#define LFS_TRACE(...) LFS_TRACE_(__VA_ARGS__, "")
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#define LFS_EMUBD_TRACE(...) LFS_TRACE_(__VA_ARGS__, "")
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// note these are indirectly included in any generated files
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#include "bd/lfs_emubd.h"
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#include <stdio.h>
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// give source a chance to define feature macros
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#undef _FEATURES_H
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#undef _STDIO_H
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// generated test configurations
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struct lfs_config;
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enum test_flags {
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TEST_INTERNAL = 0x1,
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TEST_REENTRANT = 0x2,
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};
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typedef uint8_t test_flags_t;
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typedef struct test_define {
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intmax_t (*cb)(void *data, size_t i);
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void *data;
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size_t permutations;
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} test_define_t;
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struct test_case {
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const char *name;
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const char *path;
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test_flags_t flags;
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const test_define_t *defines;
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size_t permutations;
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bool (*filter)(void);
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void (*run)(struct lfs_config *cfg);
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};
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struct test_suite {
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const char *name;
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const char *path;
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test_flags_t flags;
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const char *const *define_names;
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size_t define_count;
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const struct test_case *cases;
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size_t case_count;
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};
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extern const struct test_suite *const test_suites[];
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extern const size_t test_suite_count;
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// this is defined as true when powerloss-testing
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extern bool test_pl;
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#define TEST_PL test_pl
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// deterministic prng for pseudo-randomness in testes
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uint32_t test_prng(uint32_t *state);
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#define TEST_PRNG(state) test_prng(state)
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// generation of specific permutations of an array for exhaustive testing
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size_t test_factorial(size_t x);
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void test_permutation(size_t i, uint32_t *buffer, size_t size);
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#define TEST_FACTORIAL(x) test_factorial(x)
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#define TEST_PERMUTATION(i, buffer, size) test_permutation(i, buffer, size)
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// access generated test defines
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intmax_t test_define(size_t define);
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#define TEST_DEFINE(i) test_define(i)
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// a few preconfigured defines that control how tests run
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#define TEST_IMPLICIT_DEFINE_COUNT 12
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#define TEST_GEOMETRY_DEFINE_COUNT 3
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#define READ_SIZE_i 0
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#define PROG_SIZE_i 1
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#define BLOCK_SIZE_i 2
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#define BLOCK_COUNT_i 3
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#define DISK_SIZE_i 4
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#define CACHE_SIZE_i 5
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#define LOOKAHEAD_SIZE_i 6
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#define BLOCK_CYCLES_i 7
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#define ERASE_VALUE_i 8
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#define ERASE_CYCLES_i 9
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#define BADBLOCK_BEHAVIOR_i 10
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#define POWERLOSS_BEHAVIOR_i 11
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#define READ_SIZE TEST_DEFINE(READ_SIZE_i)
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#define PROG_SIZE TEST_DEFINE(PROG_SIZE_i)
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#define BLOCK_SIZE TEST_DEFINE(BLOCK_SIZE_i)
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#define BLOCK_COUNT TEST_DEFINE(BLOCK_COUNT_i)
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#define DISK_SIZE TEST_DEFINE(DISK_SIZE_i)
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#define CACHE_SIZE TEST_DEFINE(CACHE_SIZE_i)
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#define LOOKAHEAD_SIZE TEST_DEFINE(LOOKAHEAD_SIZE_i)
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#define BLOCK_CYCLES TEST_DEFINE(BLOCK_CYCLES_i)
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#define ERASE_VALUE TEST_DEFINE(ERASE_VALUE_i)
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#define ERASE_CYCLES TEST_DEFINE(ERASE_CYCLES_i)
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#define BADBLOCK_BEHAVIOR TEST_DEFINE(BADBLOCK_BEHAVIOR_i)
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#define POWERLOSS_BEHAVIOR TEST_DEFINE(POWERLOSS_BEHAVIOR_i)
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#define TEST_IMPLICIT_DEFINES \
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/* name value (overridable) */ \
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TEST_DEF(READ_SIZE, PROG_SIZE ) \
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TEST_DEF(PROG_SIZE, BLOCK_SIZE ) \
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TEST_DEF(BLOCK_SIZE, 0 ) \
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TEST_DEF(BLOCK_COUNT, DISK_SIZE/BLOCK_SIZE ) \
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TEST_DEF(DISK_SIZE, 1024*1024 ) \
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TEST_DEF(CACHE_SIZE, lfs_max(64, lfs_max(READ_SIZE, PROG_SIZE)) ) \
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TEST_DEF(LOOKAHEAD_SIZE, 16 ) \
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TEST_DEF(BLOCK_CYCLES, -1 ) \
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TEST_DEF(ERASE_VALUE, 0xff ) \
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TEST_DEF(ERASE_CYCLES, 0 ) \
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TEST_DEF(BADBLOCK_BEHAVIOR, LFS_EMUBD_BADBLOCK_PROGERROR ) \
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TEST_DEF(POWERLOSS_BEHAVIOR, LFS_EMUBD_POWERLOSS_NOOP )
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#define TEST_GEOMETRIES \
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/* name read_size prog_size block_size */ \
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TEST_GEO("default", 16, 16, 512 ) \
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TEST_GEO("eeprom", 1, 1, 512 ) \
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TEST_GEO("emmc", 512, 512, 512 ) \
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TEST_GEO("nor", 1, 1, 4096 ) \
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TEST_GEO("nand", 4096, 4096, 32768 )
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#endif
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