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runners: Added optional BENCH/TEST_NAND geometry

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Having BENCH/TEST_NAND ifdefs that enable the relevant timings, but
_not_ the relevant geometry, is certainly a choice.

Defaulting to NAND geometry when BENCH/TEST_NAND is defined is more
useful, if only for minimizing confusion.
This commit is contained in:
Christopher Haster
2026-01-31 21:49:56 -06:00
parent f76bd279ba
commit b1d8114889
2 changed files with 25 additions and 5 deletions
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runners/bench_defines.h
+14 -2
View File
@@ -4,9 +4,17 @@
// preconfigured defines that control how benches run // preconfigured defines that control how benches run
#ifdef BENCH_DEFINE #ifdef BENCH_DEFINE
// name value (overridable) // name value (overridable)
#ifndef BENCH_NAND
// NOR flash geometry
BENCH_DEFINE(READ_SIZE, 1 ) BENCH_DEFINE(READ_SIZE, 1 )
BENCH_DEFINE(PROG_SIZE, 1 ) BENCH_DEFINE(PROG_SIZE, 1 )
BENCH_DEFINE(BLOCK_SIZE, 4096 ) BENCH_DEFINE(BLOCK_SIZE, 4096 )
#else
// NAND flash geometry
BENCH_DEFINE(READ_SIZE, 1 )
BENCH_DEFINE(PROG_SIZE, 512 )
BENCH_DEFINE(BLOCK_SIZE, 131072 )
#endif
BENCH_DEFINE(BLOCK_COUNT, DISK_SIZE/BLOCK_SIZE ) BENCH_DEFINE(BLOCK_COUNT, DISK_SIZE/BLOCK_SIZE )
BENCH_DEFINE(DISK_SIZE, 1024*1024 ) BENCH_DEFINE(DISK_SIZE, 1024*1024 )
BENCH_DEFINE(BLOCK_RECYCLES, -1 ) BENCH_DEFINE(BLOCK_RECYCLES, -1 )
@@ -26,7 +34,9 @@
BENCH_DEFINE(LOOKGBMAP_THRESH, BLOCK_COUNT/4 ) BENCH_DEFINE(LOOKGBMAP_THRESH, BLOCK_COUNT/4 )
BENCH_DEFINE(ERASE_VALUE, 0xff ) BENCH_DEFINE(ERASE_VALUE, 0xff )
#ifndef BENCH_NAND #ifndef BENCH_NAND
// default timings for NOR flash, based on w25q64jv: // NOR flash timings
//
// based on w25q64jv:
// https://www.winbond.com/resource-files/ // https://www.winbond.com/resource-files/
// W25Q64JV%20RevM%2012242024%20Plus.pdf // W25Q64JV%20RevM%2012242024%20Plus.pdf
// //
@@ -67,7 +77,9 @@
BENCH_DEFINE(ERASED_TIMING, 10986 ) BENCH_DEFINE(ERASED_TIMING, 10986 )
#endif #endif
#else #else
// default timings for NAND flash, based on w25n01gv: // NAND flash timings
//
// based on w25n01gv:
// https://www.winbond.com/resource-files/W25N01GV%20Rev%20R%20070323.pdf // https://www.winbond.com/resource-files/W25N01GV%20Rev%20R%20070323.pdf
// //
// FR=104 MHz, quad read/prog (9.6 ns * 8/4) // FR=104 MHz, quad read/prog (9.6 ns * 8/4)
runners/test_defines.h
+11 -3
View File
@@ -4,9 +4,17 @@
// preconfigured defines that control how tests run // preconfigured defines that control how tests run
#ifdef TEST_DEFINE #ifdef TEST_DEFINE
// name value (overridable) // name value (overridable)
TEST_DEFINE(READ_SIZE, 1 ) #ifndef TEST_NAND
TEST_DEFINE(PROG_SIZE, 1 ) // NOR flash geometry
TEST_DEFINE(BLOCK_SIZE, 4096 ) TEST_DEFINE(READ_SIZE, 1 )
TEST_DEFINE(PROG_SIZE, 1 )
TEST_DEFINE(BLOCK_SIZE, 4096 )
#else
// NAND flash geometry
TEST_DEFINE(READ_SIZE, 1 )
TEST_DEFINE(PROG_SIZE, 512 )
TEST_DEFINE(BLOCK_SIZE, 131072 )
#endif
TEST_DEFINE(BLOCK_COUNT, DISK_SIZE/BLOCK_SIZE ) TEST_DEFINE(BLOCK_COUNT, DISK_SIZE/BLOCK_SIZE )
TEST_DEFINE(DISK_SIZE, 1024*1024 ) TEST_DEFINE(DISK_SIZE, 1024*1024 )
TEST_DEFINE(BLOCK_RECYCLES, -1 ) TEST_DEFINE(BLOCK_RECYCLES, -1 )