Cleaned up test script and directory naming
- Removed old tests and test scripts
- Reorganize the block devices to live under one directory
- Plugged new test framework into Makefile
renamed:
- scripts/test_.py -> scripts/test.py
- tests_ -> tests
- {file,ram,test}bd/* -> bd/*
It took a surprising amount of effort to make the Makefile behave since
it turns out the "test_%" rule could override "tests/test_%.toml.test"
which is generated as part of test.py.
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/*
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* Testing block device, wraps filebd and rambd while providing a bunch
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* of hooks for testing littlefs in various conditions.
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*
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* Copyright (c) 2017, Arm Limited. All rights reserved.
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* SPDX-License-Identifier: BSD-3-Clause
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*/
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#ifndef LFS_TESTBD_H
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#define LFS_TESTBD_H
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#include "lfs.h"
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#include "lfs_util.h"
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#include "bd/lfs_rambd.h"
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#include "bd/lfs_filebd.h"
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#ifdef __cplusplus
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extern "C"
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{
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#endif
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// Mode determining how "bad blocks" behave during testing. This
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// simulates some real-world circumstances such as writes not
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// going through (noprog), erases not sticking (noerase), and ECC
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// failures (noread).
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enum lfs_testbd_badblock_behavior {
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LFS_TESTBD_BADBLOCK_NOPROG = 0,
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LFS_TESTBD_BADBLOCK_NOERASE = 1,
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LFS_TESTBD_BADBLOCK_NOREAD = 2,
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};
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// Type for measuring wear
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typedef uint32_t lfs_testbd_wear_t;
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typedef int32_t lfs_testbd_swear_t;
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// testbd config, this is required for testing
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struct lfs_testbd_config {
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// 8-bit erase value to use for simulating erases. -1 does not simulate
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// erases, which can speed up testing by avoiding all the extra block-device
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// operations to store the erase value.
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int32_t erase_value;
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// Number of erase cycles before a block becomes "bad". The exact behavior
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// of bad blocks is controlled by the badblock_mode.
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uint32_t erase_cycles;
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// The mode determining how bad blocks fail
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uint8_t badblock_behavior;
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// Number of write operations (erase/prog) before forcefully killing
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// the program with exit. Simulates power-loss. 0 disables.
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uint32_t power_cycles;
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// Optional buffer for RAM block device.
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void *buffer;
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// Optional buffer for wear
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void *wear_buffer;
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};
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// testbd state
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typedef struct lfs_testbd {
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union {
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struct {
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lfs_filebd_t bd;
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struct lfs_filebd_config cfg;
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} file;
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struct {
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lfs_rambd_t bd;
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struct lfs_rambd_config cfg;
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} ram;
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} u;
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bool persist;
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uint32_t power_cycles;
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lfs_testbd_wear_t *wear;
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const struct lfs_testbd_config *cfg;
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} lfs_testbd_t;
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/// Block device API ///
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// Create a test block device using the geometry in lfs_config
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//
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// Note that filebd is used if a path is provided, if path is NULL
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// testbd will use rambd which can be much faster.
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int lfs_testbd_create(const struct lfs_config *cfg, const char *path);
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int lfs_testbd_createcfg(const struct lfs_config *cfg, const char *path,
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const struct lfs_testbd_config *bdcfg);
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// Clean up memory associated with block device
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int lfs_testbd_destroy(const struct lfs_config *cfg);
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// Read a block
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int lfs_testbd_read(const struct lfs_config *cfg, lfs_block_t block,
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lfs_off_t off, void *buffer, lfs_size_t size);
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// Program a block
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//
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// The block must have previously been erased.
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int lfs_testbd_prog(const struct lfs_config *cfg, lfs_block_t block,
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lfs_off_t off, const void *buffer, lfs_size_t size);
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// Erase a block
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//
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// A block must be erased before being programmed. The
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// state of an erased block is undefined.
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int lfs_testbd_erase(const struct lfs_config *cfg, lfs_block_t block);
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// Sync the block device
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int lfs_testbd_sync(const struct lfs_config *cfg);
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/// Additional extended API for driving test features ///
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// Get simulated wear on a given block
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lfs_testbd_swear_t lfs_testbd_getwear(const struct lfs_config *cfg,
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lfs_block_t block);
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// Manually set simulated wear on a given block
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int lfs_testbd_setwear(const struct lfs_config *cfg,
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lfs_block_t block, lfs_testbd_wear_t wear);
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#ifdef __cplusplus
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} /* extern "C" */
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#endif
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#endif
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