Moved emulation of erase values up into lfs_testbd

Yes this is more expensive, since small programs need to rewrite the
whole block in order to conform to the block device API. However, it
reduces code duplication and keeps all of the test-related block device
emulation in lfs_testbd.

Some people have used lfs_filebd/lfs_rambd as a starting point for new block
devices and I think it should be clear that erase does not need to have side
effects. Though to be fair this also just means we should have more
examples of block devices...
This commit is contained in:
Christopher Haster
2022-08-17 11:50:45 -05:00
parent b08463f8de
commit a368d3a07c
6 changed files with 127 additions and 147 deletions
+6 -3
View File
@@ -50,7 +50,7 @@ typedef int32_t lfs_testbd_swear_t;
// testbd config, this is required for testing
struct lfs_testbd_config {
// 8-bit erase value to use for simulating erases. -1 does not simulate
// erases, which can speed up testing by avoiding all the extra block-device
// erases, which can speed up testing by avoiding the extra block-device
// operations to store the erase value.
int32_t erase_value;
@@ -68,8 +68,11 @@ struct lfs_testbd_config {
// Optional buffer for RAM block device.
void *buffer;
// Optional buffer for wear
// Optional buffer for wear.
void *wear_buffer;
// Optional buffer for scratch memory, needed when erase_value != -1.
void *scratch_buffer;
};
// testbd state
@@ -77,7 +80,6 @@ typedef struct lfs_testbd {
union {
struct {
lfs_filebd_t bd;
struct lfs_filebd_config cfg;
} file;
struct {
lfs_rambd_t bd;
@@ -88,6 +90,7 @@ typedef struct lfs_testbd {
bool persist;
uint32_t power_cycles;
lfs_testbd_wear_t *wear;
uint8_t *scratch;
const struct lfs_testbd_config *cfg;
} lfs_testbd_t;